Dr. Petkov graduated from Sofia University in 1998 and then completed his PhD in Physical and Materials Chemistry from the University of Munich (LMU) in 2004. He was a post-doctoral fellow at LMU and University College Cork (UCC) before taking a chief technologist position at the Electron Microscopy and Analysis Facility at Tyndall National Institute. At Tyndall he is leading research area in advanced electron microscopy for analysis of semiconductor materials and devices. His research interests are in-situ and correlative electron microscopy, tomographic imaging, materials processing and self-assembly. He has authored and co-authored over 60 peer-review publications, several reviews and book chapters.